Applications of Surface Analysis Techniques to Studies of Adhesion.
Abstract
The question is often asked, 'which is the best surface chemistry tool for research on adhesive bonding?' This question is difficult to answer because it depends on the aspects of adhesion which is being studied. Often a combination of instruments must be used to take advantage of the strong points of each. In metal-to-metal bonding there are many facets of adhesive/adherend interaction. Elemental characterization of adherends, especially when composition with depth is desired, is often best accomplished with Auger Electron Spectroscopy (AES). When information of chemical bonding is required, X-Ray Photoelectron Spectroscopy (XPS) is the choice of most workers. Extremely thin layers of material (when first layer surface sensitivity is needed) requires Ion Scattering Spectrometry (ISS). The high sensitivity of Secondary Ion Mass Spectrometry (SIMS) to many elements important in adhesive bonding makes this technique useful, especially coupled with other methods, such as ISS and AES. Modern surface analysis along with Scanning Electron Microscopy (SEM) provides information on failure surfaces to allow unequivocal determination of the mode of failure. Problems such as charging and decomposition under the probing beam are encountered when characterizing the part of the failure surfaces containing the adhesive.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1979
- Accession Number
- ADA077520
Entities
People
- William L. Baun
Organizations
- Air Force Research Laboratory