Validation of the Dairchem Code I: Quiet Midlatitude Conditions.

Abstract

Two long-standing problems in the atmospheric sciences have been the correct modeling of the ion chemistry in the earth's atmosphere and the proper determination of the ion species and densities through in situ measurments. Comparison between experimental data and simulations of those data by computer modeling of atmospheric chemistry is a means of validating the computer code as well as indicating which processes are in need of further study. The DAIRCHEM computer code is used here to simulate data taken in the midlatitude D region during quiet conditions. Comparison between the total positive ion density profile derived from rocket measurements and the one computed by the code shows very good agreement in the 30 to 90 km range, with the exception that the simulated ion density profile is of somewhat smaller magnitude that the experimental one in the 60 and 75 km region. Such a discrepancy is only partially explained by the uncertainties in the ionization rate of NO due to Lyman alpha radiation. Comparison between the measured and the computed electron density profiles shows that the measured profile is consistently of a smaller magnitude that the computer profile in the 65 and 85 km range.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1979
Accession Number
ADA077880

Entities

People

  • Joseph M. Heimerl
  • Melvin G. Heaps

Organizations

  • Atmospheric Sciences Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Acquisition
  • Altitude
  • Artillery
  • Atmospheric Chemistry
  • Atmospheric Sciences
  • Chemistry
  • Coefficients
  • Data Acquisition
  • Electron Density
  • Ionization
  • Measurement
  • Military Research
  • Simulations
  • United States
  • Water Vapor
  • Weapons
  • Weapons Effects

Readers

  • Computational Modeling and Simulation
  • Plasma Physics.
  • Spectroscopy.

Technology Areas

  • Microelectronics