Measurement of Nanosecond and Sub-Nanosecond Lifetimes

Abstract

A technique to determine the lifetime of induced luminescence in subnanosecond time frames has been developed. The excitation source is a picosecond Q-switched Nd glass or Ruby laser with a frequency multiplier. The luminescence intensity profile of a single pulse is photographically recorded from an oscilloscope trace. A convolution technique is applied to analyze the traces with the use of a computer program, NLCON. The program gives values of lifetime as a function of root mean squares and produces the plots of the observed and calculated luminescence profiles.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1978
Accession Number
ADA078206

Entities

People

  • Joseph F. Roach
  • Masato Nakashima
  • Matthew L. Herz

Organizations

  • United States Army Soldier Systems Center

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Computer Programs
  • Computers
  • Convolution Integrals
  • Detection
  • Detectors
  • Fluorescence
  • Laser Applications
  • Laser Pulses
  • Lasers
  • Luminescence
  • Materials
  • Materials Engineering
  • Measurement
  • Nanosecond Time
  • Peak Values
  • Ruby Lasers
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Chemistry (specifically Chemical Fluorescence)
  • Geodesy
  • Optical Physics and Photonics.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers