XM587E2/XM724 Electronic Time Fuzes: Developmental Test/Operational Test (DT/OT) II Test Phase

Abstract

This report documents the continuation of activities and accomplishments in the further development of the XM587E2 and XM724 Electronic Time (ET) fuzes. The hardware built under this effort provided quantities of fuzes for use in Development Test/Operational Test (DT/OT) II Testing, spare piece parts, dummy fuzes, training models of the fuzes and display itmes. This effort also included an investigation into the feasibility of simplifying the hybrid circuits used in the fuze electronics. In addition, this effort included the development of an electronics assembly with all components mounted on a single printed circuit card.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1979
Accession Number
ADA078807

Entities

People

  • W. L. Aschenbeck

Organizations

  • Honeywell International, Inc.

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Acceptance Tests
  • Circuit Boards
  • Drop Tests
  • Failure Mode And Effect Analysis
  • Films
  • Manufacturing
  • Material Degradation Processes
  • Printed Circuit Boards
  • Printed Circuits
  • Semiconductor Devices
  • Semiconductors
  • Shock Tests
  • Test And Evaluation
  • Test Methods
  • Thick Films
  • Thin Films
  • Transistors

Readers

  • Fire Suppression Systems Design.
  • Integrated Circuit Design and Technology.
  • Logistics and Supply Chain Management.

Technology Areas

  • Microelectronics