Calculation of the Singularity Expansion Method Parameters from the Transient Response of a Thin Wire.
Abstract
The problem of determining the singularity expansion method (SEM) parameters from transient thin-wire data is examined. A computer code is used to generate response data. The SEM parameters are computed from these data. For noisy data, it is shown that the parameter values can be improved by signal averaging. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1979
- Accession Number
- ADA078852
Entities
People
- J. T. Cordaro
- Kah-song Cho
Organizations
- University of New Mexico