Photoemission Yields at Low X-Ray Energies.
Abstract
Photoelectron emission parameters have been studied using x radiation in the 1 to 6 keV range. A retarding-potential analyzer was developed to determine the yields of primary electrons about 50 eV and secondary electrons below 50 eV. Yields were measured at eight monochromatic x-ray energies using photoemitting surfaces of gold, silver, aluminum, titanium, silicon, deposited graphite, glass, anodized aluminum, Mylar and Saranwrap. The primary yields agreed well with previous results for Au, Al and Ti. The ratios of primary to secondary yields were highest at the low end of the photon-energy range; at 1.26 keV, these secondary-to-primary ratios ranged from about 6 for the oxides of Al and Si down to only 1.2 for Mylar. Supplementary total yield measurements on the above materials were made using pulsed low-energy x radiation. Studies were begun on measuring and analyzing the energy distribution of primary electrons. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 30, 1979
- Accession Number
- ADA079983
Entities
People
- M. J. Bernstein