Stress Pulse Tail Experiments with Electron Beams and Underground Test

Abstract

The Split-Hopkinson bar technique has been used to study the late time stress amplitude from blow-off of quartz phenolic, tape wrapped carbon phenolic, and phenolic resin by pulsed electron beams and underground test irradiation. In all cases, the stress decreased to less than 10 bars within 10 to 20 microseconds after the main stress peak. There is no late time stress of sufficient amplitude to significantly affect material or structural response. This result indicates that the prompt impulse, not total impulse, should be used for calculations, correlations and above ground simulations. The thin piezoelectric crystal was also used in a new gauge design (CMX gauge) for long time stress recording in one-dimensional strain geometry with high frequency response and very high stress sensitivity. The one-dimensional read time is limited only by the size of the irradiated area. The gauge was tested with simultaneous laser velocity interferometer measurements. The limited data obtained with the CMX gauge indicated that the stress history is recorded in detail permitting integration to determine the impulse generation as a function of time.

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Document Details

Document Type
Technical Report
Publication Date
Jan 30, 1979
Accession Number
ADA080550

Entities

People

  • David A. Rice
  • Donald V. Keller

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Composite Materials
  • Electron Beams
  • Frequency
  • Frequency Response
  • Geometry
  • Interferometers
  • Materials
  • Materials Laboratories
  • Materials Testing
  • Measurement
  • Military Research
  • Optical Materials
  • Piezoelectric Crystals
  • Structural Response
  • Two Dimensional
  • Wave Propagation
  • Waves

Fields of Study

  • Physics

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Mechanical Engineering/Mechanics of Materials.
  • Seismology

Technology Areas

  • Directed Energy
  • Microelectronics