Lineshape Analysis for Capacitance Transient Spectra.
Abstract
The capacitance transient spectroscopic technique is described along with the major variations in the techniques depending on the particular instrumentation used to process the capacitance transient. Expressions for the theoretical line shape are derived for the lock-in amplifier version of the technique with arbitrary phase setting. The results show excellent agreement with experimental spectra. Expressions are derived which are useful in determining defect level parameters from a single spectrum, rather than from an Arrhenius plot from a series of spectra. A computer program is given for plotting theoretical spectra, which is useful for determining the effects of defect level parameters on spectra and for unfolding complex spectra. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1979
- Accession Number
- ADA081874
Entities
People
- John T. Schott
Organizations
- Rome Laboratory