ISS-SIMS and AES-SIMS Characterization of Mica Surfaces.
Abstract
Secondary Ion Mass Spectrometry (SIMS), Ion Scattering Spectrometry (ISS), and Auger Electron Spectrometry (AES) are used to characterize mica surfaces. The results on matching cleaved surfaces show that cleavage occurs along the potassium layer and the potassium ions are shared equally between the separated surfaces. A comparison of these freshly cleaved surfaces with original weathered surfaces show large differences in the potassium content. Perhaps very slow potassium depletion takes place from mica surfaces under ambient conditions. Other ISS/SIMS data from treated mica surfaces show a high sensitivity for small chemical changes which take place on these surfaces. The experiments indicate that ISS/SIMS technique should prove very useful for diffusion studies through thin films using mica surfaces. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1980
- Accession Number
- ADA082045
Entities
People
- J. S. Solomon
- W. L. Baun
Organizations
- University of Dayton