Built-in-Test and External Tester Reliability Characteristics.

Abstract

This report presents the results of a study of built-in-test (BIT) and external test equipment reliability impact on prime equipment design and maintenance down time. Sixty (60) units were analyzed from the S-3A, C-5A, and MK-86 weapons systems to develop BIT and external tester measurement effectiveness versus unit design characteristics. Tradeoff criteria are developed for predicting BIT and test equipment reliability during the acquisition of new systems. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1980
Accession Number
ADA083488

Entities

People

  • Donald E. Tuttle
  • Richard Loveless

Organizations

  • Lockheed Martin

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Air Force
  • Computer Programs
  • Control Systems
  • Detection
  • Detectors
  • Electronic Equipment
  • Maintenance
  • Measurement
  • Navigation
  • Radar
  • Radio Frequency
  • Radio Frequency Amplifiers
  • Recording Systems
  • Regression Analysis
  • Test And Evaluation
  • Test Equipment
  • Warning Systems

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Software Engineering