X-Ray Techniques for the Measurement of Residual Stresses in the Real World.
Abstract
The principles of the X-ray method of measuring residual stresses are reviewed, with special emphasis on the latest developments in both procedures and equipment. Rapid in-the-field measurements are now being performed. It is possible to obtain stress gradients without layer removal and to obtain the entire stress tensor (not just the surface stress). (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 08, 1980
- Accession Number
- ADA083796
Entities
People
- Jerome B. Cohen
Organizations
- Northwestern University