Surface Characterization of Chemically Treated Titanium and Titanium Alloys.

Abstract

A thorough knowledge of adherend surfaces is necessary to adequately evaluate adhesive bond joint performance. Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectroscopy (SIMS), SCanning Electron Microscopy (SEM), and X-Ray Photoelectron Spectroscopy (XPS) were used to characterize the surface topography (roughness, selective etching) composition (relative concentration of alloyed element on surface, contaminated overlayer...) chemical state (titanium or alloy surface oxide, oxy-fluoride...) and oxide thickness of different chemically treated titanium alloys. Seven alloys and the metal were conditioned with seven different chemical treatments. Data from each treated alloy has been compiled to show physical and chemical effects of each treatment on each alloy. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1980
Accession Number
ADA084171

Entities

People

  • Alain A. Roche

Organizations

  • Universal Energy Systems

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Chemistry
  • Crystal Structure
  • Electron Beams
  • Electron Microscopy
  • Electron Spectroscopy
  • Mass Spectroscopy
  • Materials
  • Materials Laboratories
  • Materials Science
  • Microscopy
  • Scanning Electron Microscopy
  • Spectra
  • Spectrometry
  • Spectroscopy
  • Titanium Alloys

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Surface Coatings Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene