Metal-Ceramic Seals.
Abstract
This program describes the results obtained during a one year study program on high power microwave and millimeter wave windows. The objective of this program was to investigate the applicability of a new ceramic metalization process to the fabrication of waveguide windows. The new metallization process, developed recently by Northrop, consists in sputtering a Ti-Mo-Cu Layer onto the ceramic and has shown to exhibit extremely high bond strength, reliability and very low thermal barriers and rf losses when compared to the classical Mo-Mn metallization. Three types of rf windows were fabricated, mainly for I/J band applications: circular windows, rectangular waveguide windows and coaxial windows. The advantages of the Ti-Mo-Cu metallization process as compared to the classical Mo-Mn process have been quantitatively defined, and excellent results have been obtained. The rf losses have been found to be excellent if cusil is used as brazing alloy, and extremely low thermal barriers have been measured. The use of Au/Cu brazing alloys results in higher reliability under thermal cycling conditions, but increases drastically the rf losses. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1979
- Accession Number
- ADA084860
Entities
People
- Gunther Dohler
- Yeldez Amer