Integrated Circuit Tester Evaluation Study.
Abstract
The primary AIMD test requirements for a small, inexpensive, commercially available, digital IC tester could be met by only one tester. This was the automatic Fault Isolation Tester (AFIT) model 2050 manufactured by Testline Co. Many other testers were available that had the basic testing capability but were outside the price constraints or that were edge board testers. Bed-of-nails testers were not considered for AIMD use. The AFIT was submitted for technical and User Evaluations and demonstrated that it could detect faulty IC's on PC boards not coated with a conformal moisture-proofing compound. This fault detection ability was demonstrated for both the in-circuit and out-of-circuit modes of operation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 05, 1980
- Accession Number
- ADA084961
Entities
People
- P. Stevens
Organizations
- Naval Air Engineering Station Lakehurst