Spectral Emissivity at High Temperatures

Abstract

Progress on the development work on the Spectral Emissometer used in conjunction with the high temperature multiproperty apparatus is described. The emissometer has been demonstrated to yield state-of-the-art accuracy for the spectral emissivity in the 1.5 to 15 micrometer range above 1300K for opaque solids. Both electrically conducting and opaque insulating samples of high technological interest have been studied. The present work was aimed primarily at increasing sensitivity to allow measurements at lower temperatures and to provide the basis for investigating semi-transparent materials.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1980
Accession Number
ADA085297

Entities

People

  • D. P. Dewitt
  • Philip E. Johnson
  • R. E. Taylor

Organizations

  • Purdue University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Accuracy
  • Advanced Materials
  • Ceramic Materials
  • Dielectrics
  • Emissivity
  • Emissometers
  • Graphitic Materials
  • High Temperature
  • Materials
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Measurement
  • Measuring Instruments
  • Physical Properties
  • Silicon Carbide
  • Thermophysical Properties

Fields of Study

  • Physics

Readers

  • Semiconductor Device Technology
  • Thermal Physics or Thermal Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems