Electromigration and Theromomigration in Metals.
Abstract
The object of this research was to investigate theoretically the driving force for electromigration and thermomigration in metals. The driving force for electromigration was shown to be equal to the local electric field accompanying electron transport. The force was determined from the linear response expression of Kumar and Sorbello using both the Green's function formalism and the Kohn-Luttinger formalism. Corrections to previous force expressions were derived. The effects of atomic configuration on electromigration was investigated within a pseudoatom picture. Application was made to lattice distortion, fast-diffusers, grain boundaries and isotope effects. Calculations were made of the driving force in liquid-metal alloys and were found to be in agreement with experiment. The kohn-Luttinger formalism was applied to electromigration in an inversion layer. The diving force for thermomigration was examined. A linear-response expression was derived for the electronic component of the driving force.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 15, 1980
- Accession Number
- ADA085524
Entities
People
- Richard S. Sorbello
Organizations
- University of Wisconsin–Milwaukee