Study of a Computer Assisted Test Program.

Abstract

As systems become more and more complex, the need for good fault diagnostic procedures becomes more obvious. In recent years much work has been done on the fault analysis of digital circuits, primarily because the growth in the size of these circuits has necessitated good fault diagnostic tests. The two state nature ('1' or '0') of digital circuits has also made them more amenable to the development of reasonably simple and reliable test procedures. In contrast, research on fault diagnostic procedures for analog circuits has not been as fruitful, nor have the pressures to develop good fault diagnostic tests for analog circuits been as great due to their relatively small number of components in comparison with digital systems. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1979
Accession Number
ADA085753

Entities

People

  • Adel A. Sakla

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Algorithms
  • Circuit Analysis
  • Circuits
  • Computations
  • Digital Circuits
  • Electronic Circuits
  • Equivalent Circuits
  • Frequency
  • Impedance
  • Linear Systems
  • Low Pass Filters
  • Measurement
  • Short Circuits
  • Simulations
  • Transfer Functions

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
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  • Theoretical Analysis.