Impurity Studies in Single Crystal Cadmium Sulfide.

Abstract

In cadmium sulfide crystals an easily observed and measured phenomenon is the low temperature bound exciton emission spectrum. The spectral lines are sharp, and their wavelength can be measured with considerable precision. The spectral position of the lines in a magnetic field can tell us much about the symmetry and structure of the center. The purpose of this work was to establish a relationship between the bound exciton spectra and defect or impurity structure of the crystal. A line associated with a neutral donor and a pair of lines associated with an ionized donor were found for the very purest material. A neutral donor was found for crystals equilibrated in hydrogen, and a pair of ionized donors for material equilibrated in hydrogen sulfide. Lithium doped crystals showed several pairs of ionized donor lines as well as a large number of characteristic neutral donor lines. Silver doping produced a large number of characteristic lines, but the nature of the associated centers has not been established. Sodium showed many characteristic lines, some associated with neutral donors, some with ionized donors, as well as lines clearly associated with complex structures. Potassium and rubidium both showed characteristic ionized donor lines. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1979
Accession Number
ADA086741

Entities

People

  • Lawrence C. Greene

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Alkali Metals
  • Chemistry
  • Compound Semiconductors
  • Crystal Lattice Vibrations
  • Crystal Lattices
  • Emission Spectra
  • Energy Bands
  • Energy Levels
  • Materials
  • Materials Laboratories
  • Measurement
  • Optical Properties
  • Semiconductors
  • Silicon Carbide
  • Solid State Physics
  • Spectra
  • Spectral Lines

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics