Design Guidelines and Optimization Procedures for Test Subsystem Design.

Abstract

This study provides guidelines and procedures to optimize the design of built-in-test equipment. The procedures are applicable to the design of both avionic and ground electronic systems. Optimization of the test subsystem is achieved by properly specifying three key design parameters (test effectiveness, mean corrective maintenance time, and test subsystem production costs) during the Conceptual Phase. These parameters then form the 'design to' criteria for optimization during the System, Subsystem, and Detail Design Phases. The report provides straightforward mathematical tools, algorithms, and trade-off procedures to assist the designer during each design phase. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1980
Accession Number
ADA087059

Entities

People

  • Donald N. Lord
  • George A. Walz
  • Stan Green

Organizations

  • Grumman

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Ground and Sea Platforms
  • Human Systems
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Computer Programming
  • Computer Programs
  • Detection
  • Detectors
  • Electronic Equipment
  • Engineers
  • Failure Mode And Effect Analysis
  • Maintenance
  • Maintenance Personnel
  • Measurement
  • Radar
  • Simulators
  • Systems Engineering
  • Test And Evaluation
  • Test Equipment
  • Warning Systems

Fields of Study

  • Engineering

Readers

  • Software Engineering

Technology Areas

  • Microelectronics