The Increased Attachment Due to Ionization-Induced Smog in EMP Environments.

Abstract

The increased electron attachment due to HNO3 production in the EMP source region is investigated. The HNO3 produced is found to be roughly linear with the total ionization up to an ionization value of about 2 x 10 to the 16th power ion pairs. Above this, the HNO3 production is less than linear. Although the attachment to HNO3 was not enough to explain the lightning strokes in the Mike shot, it can affect the field in the EMP source region. The attachment to other species via endothermic reactions which involve electrons which have been heated by the electric field was also investigated. It was concluded that only those reactions in which the energy change is small, such as the reactions with O3 and HNO2 and H2O2, hold much hope of contributing significantly to the overall attachment. The necessary experimental data for these reactions, however, is not available. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1979
Accession Number
ADA087850

Entities

People

  • Murray Scheibe

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Attachment
  • Charged Particles
  • Chemical Reaction Properties
  • Chemical Reactions
  • Chemistry
  • Department Of Defense
  • Electric Fields
  • Electron Density
  • Electron Energy
  • Electrons
  • Endothermic Reactions
  • Ionization
  • Ionizing Radiation
  • Military Research
  • Sea Level
  • Security

Readers

  • Combustion science or combustion engineering.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Plasma Physics.

Technology Areas

  • Microelectronics