Nuclear Radiation Effects Data on Large Scale Integrated Circuits.

Abstract

This summary tabulates nuclear radiation effects data on large scale integrated (LSI) circuits. It is intended to be a handy reference to help engineers select components for systems that must survive a given radiation level or evaluate the radiation hardness of previously designed systems. Most of the data in this report were compiled from papers presented at the Annual IEEE Conference on Nuclear and Space Radiation Effects (1971 through 1979). The remainder came from a variety of government and industry reports. Due to the complexity of testing procedures of LSI devices and the space constraints of a tabular format, not all pertinent data can be presented in this summary. We have attempted to give most of the data needed for assessing the hardness of a given component. The balance of the information can be found in the references.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1980
Accession Number
ADA089112

Entities

People

  • Harvey Eisen
  • Kelvin Pinero
  • Roland Polimadei

Organizations

  • Harry Diamond Laboratories

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Beyond Visual Range Missiles
  • Circuits
  • Hardness
  • Integrated Circuits
  • Large Scale Integrated Circuits
  • Large Scale Integration
  • Nuclear Radiation
  • Plastic Explosives
  • Radiation
  • Radiation Effects
  • Semiconductor Manufacturing
  • Three Dimensional

Fields of Study

  • Physics

Readers

  • Business Analytics
  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Space