Data Acquisition System for Panama Field Tests.

Abstract

This report covers the design and development of automatic test equipment used to evaluate transistor, microcircuit, and hybrid circuit devices undergoing field tests in the Panama Canal Zone. The devices under test are returned annually to the ERADCOM, Electronics Technology & Devices Lab, Fort Monmouth, for data collection and data processing. The test system is computer-controlled, providing automatic device parameter measurement and data manipulation, which include data editing, data printouts, and device performance summaries. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1980
Accession Number
ADA089369

Entities

People

  • J. Erickson
  • T. Redgate

Organizations

  • United States Army Communications-Electronics Command

Tags

DTIC Thesaurus Topics

  • Circuit Boards
  • Circuit Testers
  • Circuits
  • Complementary Metal-Oxide Semiconductors
  • Computers
  • Data Processing
  • Electronics
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Hybrid Circuits
  • Microcircuits
  • Modules (Electronics)
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Test Fixtures
  • Transistors

Readers

  • Aerospace Test and Evaluation
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems