CCD Corner-Turning Memory.
Abstract
Two analog CCD reformatting memories were designed and fabricated using an n-channel, double-level, self-alighed polysilicon gate process. These unique CCD structures employ two-dimensional charge transfer cells in a square memory array (32 x 32 and 64 x 64 elements) which is accessed by means of integrated CCD demultiplexer and multiplexer structures, resulting in greater dynamic range than observed in previous line-addressed designs. Details related to the design of this complex device and the results of experimental tests are presented. A secondary objective involved the development of a process-compatible bipolar output device for high speed applications. An analysis of this bipolar output circuit is presented, and experimental results are discussed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1980
- Accession Number
- ADA089729
Entities
People
- Robert J. Kansy
Organizations
- Texas Instruments