Microcircuit Device Reliability. Digital Evaluation and Failure Analysis Data. Parts 1 and 2, Summer 1980

Abstract

This compendium of digital SSI/MSI microcircuit device reliability is separated into two volumes. Part I deals with general summaries and detailed listings which address the various aspects of burn-in and environmental/ screening tests at the component level. Devices are classified according to test types and are arranged by test source, device function, operational type, device manufacturer, and commercial part number. Part II contains summaries of failure analysis data based upon failure indicators, failure modes, failure defects, failure defect causes, and failure activating stresses, as well as a detailed listing of verified failure events as derived from device- and equipment-level testing.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1980
Accession Number
ADA090586

Entities

People

  • David B. Nicholls

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Artificial Intelligence
  • Computer Programs
  • Crystal Structure
  • Data Analysis
  • Department Of Defense
  • Electromagnetic Radiation
  • Failure Mode And Effect Analysis
  • Fluoropolymers
  • Materials
  • Near Infrared Radiation
  • Operating Systems
  • Plastic Explosives
  • Semiconductors
  • Stress Tests
  • Systems Engineering
  • Test And Evaluation
  • Two Dimensional

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Integrated Circuit Design and Technology.
  • Library and Information Science

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems