New Techniques for Test Development for Tactical Autopilots Using Microprocessors,

Abstract

This paper reports on a demonstration of the application of the method to generate system level tests for a typical tactical missile autopilot. The test algorithms are based on the autopilot control law. When loaded on the tester with appropriate control information, the complete autopilot is tested to establish if the specified control law requirements are met. Thus, the test procedure not only checks to see if the hardware is functional, but also checks the operational software. The technique also uses a 'learning' mode to allow minor timing or functional deviations from the expected responses to be incorporated in the test procedures. A potential application of this test development technique is the extraction of production test data for the various subassemblies. The technique will 'learn' the input-output patterns forming the basis for developement and production tests. If successful these new techniques should allow the test development process to keep pace with semiconductor progress.

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Document Details

Document Type
Technical Report
Publication Date
Jul 10, 1980
Accession Number
ADA090641

Entities

People

  • Edward H. Shemeta

Organizations

  • Boeing

Tags

Communities of Interest

  • Materials and Manufacturing Processes
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Computer Programming
  • Computer Programs
  • Computers
  • Control Systems
  • Diagrams
  • Difference Equations
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Large Scale Integration
  • Manufacturing
  • Production
  • Semiconductors
  • Simulations
  • Systems Engineering
  • Test Equipment
  • Transfer Functions
  • Very Large Scale Integration

Readers

  • Aerospace Test and Evaluation
  • Control Systems Engineering.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems