RAM Technology Study.

Abstract

Electrical performance and radiation hardness parameters of modern RAM technologies were compared for consideration in military hardened system applications. Semiconductor technologies considered included production dynamic n-MOS, statis n-MOS, CMOS, bipolar ECL developing CMOS/SOS and bipolar I2L. For the production technologies CMOS and bipolar ECL are clear candidates for hardened systems with limited application for static n-MOS and very limited application for dynamic n-MOS. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 03, 1980
Accession Number
ADA091372

Entities

People

  • James P. Raymond

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Access Time
  • Alpha Particles
  • Amplifiers
  • Bipolar Junction Transistors
  • Computer Programming
  • Data Storage Systems
  • Electronics Laboratories
  • Ionization
  • Ionizing Radiation
  • Materials
  • Materials Laboratories
  • Modules (Electronics)
  • Power Supplies
  • Radiation Effects
  • Resistance
  • Semiconductors
  • Two Dimensional

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene