Performance Degradation of A 7400 TTL NAND Gate Due to Sinusoidal Interference.

Abstract

The investigation reported herein addresses the problem of electromagnetic susceptibility of digital circuits. Of particular interest is the desire to obtain electromagnetic interference (EMI) performance curves for digital circuits. This report describes an effort devoted to the electromagnetic susceptibility of a single integrated circuit 7400 TTL NAND gate. The investigation was carried out by means of a computer simulation using the computer program SPICE (Simulation Program with Integrated Circuit Emphasis). The report concentrates on the special case of sinusoidal interference inject at various circuit nodes. Under appropriate conditions the gate voltages and currents were observed to suffer severe waveform distortion. The computer simulation revealed that the sinusoidal interference could cause the propagation delays and the rise and fall times of the output waveforms to increase significantly. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1980
Accession Number
ADA091745

Entities

People

  • Donald D. Weiner
  • Jacob Alkalay

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Computer Programs
  • Computer Simulations
  • Computers
  • Digital Circuits
  • Electromagnetic Radiation
  • Electromagnetic Susceptibility
  • Electronic Equipment
  • Frequency
  • Integrated Circuits
  • Logic Gates
  • Nand Gates
  • Resistance
  • Semiconductors
  • Simulations
  • Steady State
  • Waveforms

Fields of Study

  • Engineering

Readers

  • Electrical Engineering
  • Radio communications and signal processing.
  • Systems Analysis and Design