Detection of Aberrant Response Patterns and Their Effect on Dimensionality.
Abstract
An index measuring the degree to which a binary response pattern conforms to some baseline pattern was defined and named the Pattern Conformity Index (PCI). By 'baseline pattern' it is meant a binary response vector with all the 0's preceding the 1's when the items are arranged in descending order of difficulty or in some other, purposefully defined order.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1980
- Accession Number
- ADA091838
Entities
People
- Kikumi K. Tatsuoka
- Maurice M. Tatsuoka
Organizations
- University of Illinois Urbana–Champaign