Detection of Aberrant Response Patterns and Their Effect on Dimensionality.

Abstract

An index measuring the degree to which a binary response pattern conforms to some baseline pattern was defined and named the Pattern Conformity Index (PCI). By 'baseline pattern' it is meant a binary response vector with all the 0's preceding the 1's when the items are arranged in descending order of difficulty or in some other, purposefully defined order.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1980
Accession Number
ADA091838

Entities

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  • Kikumi K. Tatsuoka
  • Maurice M. Tatsuoka

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  • University of Illinois Urbana–Champaign

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