Image Alignment and Correlation System.
Abstract
This report documents the development and design of the Image and Alignment and Correlation System built for the US Army Engineer Topographic Laboratories by Deft Laboratories, Inc. The purpose of the system is to provide hardware demonstration of the applicability of DEFT (Direct Electronic Fourier Transform) technology to the problems of image alignment and image cross-correlation measurement. These problems are related generally to the areas of topographic mapping, feature extraction and change detection, and photointerpretation. The development of this system is a continuation of the advancement of DEFT technology and its applications. The sensor technology has received previous sponsorship at Syracuse University by ETL and by the Night Vision Laboratories. The Image Alignment and Correlation System represents a significant achievement in the application of the technology and in its interfacing and programmable control by a microprocessor. In other words, the system represents the first real 'use' of DEFT sensor outputs. The system uses a highly developed image-adaptive alignment algorithm which exploits the spatial frequency analysis capability of the DEFT sensor.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1980
- Accession Number
- ADA091840
Entities
People
- Alan L. Moyer
- Samuel E. Craig