Repeated Likelihood Ratio Tests for Curved Exponential Families.

Abstract

A class of repeated significance tests for curved hypotheses in multiparameter exponential families is studied, and asymptotic formulae for the significance levels of such tests are obtained. Special attention is given the important case of comparing Bernoulli success probabilities. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1980
Accession Number
ADA092634

Entities

People

  • Steven Paul Lalley

Organizations

  • Stanford University

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  • Biomedical

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  • Algebra
  • Biomedical Research
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Fields of Study

  • Mathematics

Readers

  • Fluid Mechanics and Fluid Dynamics.
  • Regression Analysis.