XPS/AES Studies of Aluminum Fracture Surfaces.
Abstract
X-ray photoemission (XPS, or ESCA) and Auger electron scattering (AES) studies were made of aluminum alloy surfaces after polishing, etching, and ion bombardment, and in the as-received condition. Surfaces obtained on fracture at 10 to the minus 10th power torr were also studied by means of scanning Auger microscopy (SAM). The materials studied were 2024-T351, 7075-T651 and high purity aluminum. Aluminum was found to exist in two chemical states at the surfaces of these materials. The Al 2p line of the XPS spectra was observed at 75.8 + or - 0.2 eV, corresponding to the oxide phase, for the as-received and the polished surfaces, and at 72.6 + or - 0.2 eV corresponding to metallic aluminum, for surfaces cleaned by prolonged argon-ion bombardment. Specimens which had been etched or partially cleaned by ion bombardment exhibited both peaks, separated by the chemical shift of 3.2 eV. A similar chemical shift, previously unreported, was observed for the Al 2s line, with the aluminum oxide line at 120.5 + or - 0.5 eV and the metallic aluminum line at 110.0 + or - 0.2 eV with a chemical shift of 2.5 eV.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 15, 1980
- Accession Number
- ADA093131
Entities
People
- B .l. Averbach
Organizations
- Massachusetts Institute of Technology