Characterization of Photoelectron Emission for SGEMP Analysis.
Abstract
Photoelectron emission characteristics from SGEMP-relevant materials have been determined using both pulsed and steady-state x radiation in the 1-6 keV range. The photoemission parameters determined were spectral yields of primary electrons and total yields of secondary electrons. A magnetic spectrometer was developed to determine the time-resolved spectral yields of primary electrons generated by pulsed plasma radiation; the total yields were measured using X-ray diodes. To determine the yields of primary and secondary electrons generated by steady-state monochromatic X-rays, a retarding potential method was used. The spectral yields generated by monochromatic radiation were also determined using a magnetic spectrometer. Emitter materials included the following conductors and dielectrics: aluminum, anodized aluminum, gold, silver, copper, glass, silicon, graphite, Mylar, Kapton, Teflon, solar-cell cover glass and white thermal paint. Those materials studied using both the pulsed and steady-state radiation exhibited good agreement primary yields. Each primary-electron energy spectrum was consistent with atomic absorption edges in the material. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1980
- Accession Number
- ADA095172
Entities
People
- Melvin J. Bernstein