Self Contained Test for Digital Avionics. Designers Guide,

Abstract

The complexity of VLSI circuits considered for use in future avionics modules makes testing of these modules virtually impossible unless provisions for test are incorporated from the very beginning of design. The circuit complexity and packaging density of VLSI will make designing for testability an important requirement. With the development of a testable design, the equipment can then be maintained in a cost effective manner utilizing Self-Contained-Test(SCT) techniques. The most direct method of providing complete fault isolation in a digital system is to employ Self-Contained-Test hardware on each replaceable unit (module). This approach is practical if the SCT hardware remains in a small percentage of the total cost of the replaceable unit and requires negligible cooling and power. Systems using VLSI technology can meet the requirements as mentioned above. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1979
Accession Number
ADA096736

Entities

People

  • John E. Olejack
  • John R. Spodofora

Organizations

  • Naval Air Engineering Station Lakehurst

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Human Systems

DTIC Thesaurus Topics

  • Coding
  • Computer Programming
  • Computer Programs
  • Computers
  • Detection
  • Failure Mode And Effect Analysis
  • Insensitive Explosives
  • Integrated Circuits
  • Large Scale Integration
  • Logic
  • Logic Gates
  • Nand Gates
  • Reliability
  • Shift Registers
  • Test Equipment
  • Time Intervals
  • Very Large Scale Integration

Fields of Study

  • Engineering

Readers

  • Aerospace Engineering
  • Integrated Circuit Design and Technology.
  • Theoretical Analysis.