A Study of Flicker Noise in MOSFETs.

Abstract

Temperature fluctuations, i/f and g-r noise has been measured and empirically modeled in thin pyroelectric films, in P-implanted buried-channel and weakly inverted MOSFETs. Number and mobility fluctuation models are being used. Reference is made to papers published or in print. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1981
Accession Number
ADA097557

Entities

People

  • A. Van Der Ziel

Organizations

  • University of Minnesota

Tags

DTIC Thesaurus Topics

  • Current Limiters
  • Electric Fields
  • Electrical Engineering
  • Electronics
  • Electrons
  • Engineering
  • Frequency
  • Measurement
  • Military Research
  • Mobility
  • Noise
  • Saturation
  • Scattering
  • Semiconductors
  • Space Charge
  • Spectra
  • White Noise

Readers

  • Acoustics.
  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Integrated Circuit Design and Technology.