Correction for Loss Effects in Valence-Band XPS Spectra by Deconvolution.

Abstract

We present XPS valence band spectra for GaAs(110) and GeSe(001) that have been corrected for coherent loss effects by deconvolution of an instrument/loss function that includes a source function for an unmonochromatized source, a backscatter-electron spectrum to account for energy losses, and an analyzer function. The results are compared with background-subtracted spectra. The deconvolution yields spectra that have significantly greater intensity deep in the band, bringing measurements into closer agreement with theory than is achieved with background subtraction. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 15, 1981
Accession Number
ADA097598

Entities

People

  • G. D. Davis
  • M. G. Lagally

Organizations

  • University of Wisconsin–Madison

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Achromatic
  • Analyzers
  • Band Spectra
  • Electrons
  • Energy Bands
  • Engineering
  • Kinetic Energy
  • Materials
  • Materials Science
  • Measurement
  • Military Research
  • Photoelectrons
  • Radiation
  • Spectra
  • United States
  • Valence Bands
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Spectroscopy.
  • Wave Propagation and Nonlinear Chaotic Dynamics.

Technology Areas

  • AI & ML
  • AI & ML - Bayesian Inference
  • Microelectronics