Electrical Characterization of Single Chip Microprocessors and LSI Devices.

Abstract

The objective of this effort was to develop functional and parametric tests for selected microprocessors and to develop MIL-M-38510 slash sheets for them. A test pattern and program were developed for the 8086 and data was taken and analyzed to determine its operating region. The procedure for LSI functional development, which was used on this and previous RADC contracts, was updated. The applicability of a dedicated benchtop tester to MIL-M-38510 testing was reviewed.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 1981
Accession Number
ADA097897

Entities

People

  • Barney W. Hajduk
  • Donald Tucker
  • John Luzzi
  • Mark Peronto
  • Thomas M. Ostrowski

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Access Time
  • Accumulators
  • Clocks
  • Comparators
  • Computers
  • Demographic Cohorts
  • Frequency
  • Impedance
  • Instructions
  • Microprocessors
  • Munitions
  • Plastic Explosives
  • Verification

Fields of Study

  • Agricultural and Food sciences

Readers

  • Aerospace Test and Evaluation
  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Statistical inference.