System for the Transport Analysis of Semiconductor Materials.
Abstract
The conception, design, and realization of a system for the transport analysis of semiconductor materials is presented. A survey of the relevant literature on transport measurements is made to determine existing problems and potential contributions to the theory an to experimental methods. Theoretical contributions include a solution to the velocity-field curve for the case of arbitrary doping profile and the resulting nonuniform electric field distribution, and a treatment of diffusion effects. Improvements to the microwave time-of-flight method employed here are also presented, and an evaluation of the present system is provided. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1980
- Accession Number
- ADA098519
Entities
People
- F. J. Rosenbaum
- M. H. Homsey
- M. H. Riess
- R. E. Goldwasser
- S. L. Vonrump
Organizations
- University of Washington