Accessibility of Large-Scale Electronic Circuits,

Abstract

The problem of fault diagnosis of large-scale analog circuit is studied. Any fault diagnosis procedure is limited by the number of circuit parameters to be diagnosed. When such limit is exceeded by large-scale circuits, some kind of tearing process has to be implemented before a fault diagnosis procedure can be applied. In this paper, a tearing process via accessibility of subnetworks is presented. The necessary and sufficient condition for accessibility is obtained. The implementation of this tearing process is discussed. The tearing process can be applied to nonlinear circuits. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 20, 1978
Accession Number
ADA098734

Entities

People

  • Chia‐Hsien Lin
  • R. Liu
  • V. Visvanathan

Organizations

  • University of Notre Dame

Tags

DTIC Thesaurus Topics

  • Circuits
  • Computations
  • Electronic Circuits
  • Equations
  • Equations Of State
  • Graph Theory
  • Linear Systems
  • Networks
  • Photographs
  • Resistance
  • Resistors
  • Short Circuits
  • Terminals

Readers

  • Adaptive Control and Estimation with Uncertainty in Dynamic Systems.
  • Distributed Systems and Data Platform Development
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics