A Review of Data for Electron Mobility, Energy, and Attachment Relevant to EMP Air Chemistry.

Abstract

This report reviews the data for electron mobility, mean electron energy and electron attachment rate in moist air, for electric fields up to about 100,000 v/m.atm, corresponding to mean electron energies up to about 0.5 eV. It is found that recent mobility measurements and calculations based on published rate coefficients generally agree within about 20%. The percentage variations in the mean electron energies derived from various sources are larger, especially for moist air. However, in EMP problems the electron energy enters only as it influences the mobility or the attachment rate, which fact tends to reduce the effects of such uncertainties. The electron attachment rates calculated from various sets of data and also those measured very recently by Price and van Lint near 1 atm show a variety of discrepancies, but all results generally lie within + or - 40% of a mean curve. The data of McCorkle et al., and to some extent the data of van Lint and Price, suggest that at nitrogen partial pressures above about 0.3 atm the variation of attachment rate with electron energy changes somewhat from that observed at lower nitrogen pressures; however, the anomalies observed are neither well established nor understood at this time. The mobilities and attachment rates used in existing EMP codes generally lie within the uncertainty ranges of the best current data. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1980
Accession Number
ADA098847

Entities

People

  • F. R. Gilmore
  • M. K. Grover

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Chemistry
  • Coefficients
  • Distribution Functions
  • Electric Fields
  • Electron Energy
  • Electron Mobility
  • Electrons
  • Energy
  • Energy Transfer
  • Equations
  • Free Electrons
  • Measurement
  • Nitrogen
  • Partial Pressure
  • Test And Evaluation
  • Water Vapor

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  • Microelectronics