Single Mode Optical Waveguide Design Investigation.
Abstract
Lateral and angular offset sensitivity test equipment has been designed and built. Measurements of lateral offset sensitivity have been made on several fibers to determine reproducibility, and wavelength dependence. A modified expression for lateral offset loss which takes into account the important parameter of spot-size was studied. Microbend sensitivity measurements were made using the linear pin array and compared with the random microbend test proposed in the Technical Proposal. The pin array is proving to be more reproducible and has thus been chosen for this contract. Three fibers were determined to be within the fiber design matrix and have been chosen for study. The criteria for selecting a fiber was expanded to encompass 'equivalent-step parameters' whereby refractive index profile shapes other than the ideal step profile are taken into account. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 30, 1981
- Accession Number
- ADA098979
Entities
People
- D. B. Keck
- R. A. Westwig
- V. A. Bhagavatula
Organizations
- Corning Inc.