Fault Analysis of Analog Electronic Systems: Algorithms Based on Fuzzy Sets
Abstract
There are essentially three fundamental problems involved in achieving effective automatic generation of fault isolation tests for analog electronic systems: feature extraction, fault classification and diagnosis. For practical electronic circuits having component drifts and measurement noise, how are we able to introduce fuzzy set concepts and provide methods to achieve fault classification and diagnosis? Along with the feature extraction problem, given an electrical network of known topology, what are the conditions for testability? To attack the long standing fault isolation problem in analog electronic circuits, we have focused on two of the major problems. One is the presence of uncertainties such as indeterminacy, vagueness, randomness, and so on that naturally arise during the solution procedure of analog fault isolation. The other is the presence of topological restrictions inherent in specific circuit configurations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1979
- Accession Number
- ADA099227
Entities
People
- Jonghee Lee
Organizations
- University of Pennsylvania