Scanning Auger and Work-Function Measurements Applied to Dispenser Cathodes.

Abstract

A method to perform spatially resolved work-function measurements has been developed using a modified scanning Auger microprobe (SAM). The basis of the method is that patches of different work function give rise to different onsets of secondary electron emission. The combined SAM-work function measurement method permits a microscopic correlation of emissive or surface dipole properties with elemental composition. The system permits a surface spatial resolution of 0.2 micrometer provided by the focused incident electron beam, and a work-function resolution of better than 0.05 eV. Results are presented for elemental samples, which were used as a test of the work-function mapping ability. Some initial results on dispenser cathode surfaces are also presented. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1981
Accession Number
ADA099413

Entities

People

  • Genghmun Eng
  • H. K. Alan Kan

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Chemistry
  • Dispensers
  • Electron Beams
  • Electron Emission
  • Electron Energy
  • Electrons
  • Emission
  • Emission Spectra
  • Emitters
  • Lasers
  • Measurement
  • Photoexcitation
  • Physics Laboratories
  • Secondary Emission
  • Spectra
  • Work Functions

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Pulsed Power and Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Microelectronics