Optimum Testing Procedures for System Diagnosis and Fault Isolation.

Abstract

Even though a great deal of work has been done in developing models in the field of designing diagnostic tests for fault isolation in digital systems, there is still a lack of efficient and fast procedures. Two approaches to the cost-effective design of fault isolation procedures were presented here. They were oriented specifically toward built-in-test (BIT) diagnostic subsystems for modular electronic equipment. A branch and bound solution approach was used in order to find the optimal sequence of tests to be executed by the BIT to isolate a single malfunctioned unit among a group of line replaceable units. Computational results were presented and discussed. A computer program listing of the solution technique was included. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Mar 31, 1981
Accession Number
ADA099999

Entities

People

  • Adel A. Aly

Organizations

  • University of Oklahoma

Tags

Communities of Interest

  • C4I

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Computer Programming
  • Computer Programs
  • Computers
  • Dynamic Programming
  • Electronic Equipment
  • Engineering
  • Figure Of Merit
  • Industrial Engineering
  • Literature Surveys
  • Maintenance Personnel
  • Plastic Explosives
  • Production Engineering
  • Sequences
  • Trees (Data Structures)

Readers

  • Aerospace Test and Evaluation
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems