Characterization of III-V Semiconductors.

Abstract

Impurities and defects in semiconducting and semi-insulating GaAs and InP have been investigated by electrical, optical, and mass spectroscopic techniques. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1981
Accession Number
ADA100399

Entities

People

  • D. C. Look
  • John W. Farmer
  • Marshall M. Kreitman
  • Phil Won Yu
  • Sang Boo Nam

Organizations

  • University of Dayton

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Control Systems
  • Crystal Lattice Vibrations
  • Energy Bands
  • Fermi Levels
  • Field Effect Transistors
  • Laser Diodes
  • Mass Spectrometry
  • Mass Spectroscopy
  • Materials
  • Measurement
  • New York
  • Optical Properties
  • Semiconductor Devices
  • Semiconductors
  • Spectra
  • Spectrometry
  • Spectroscopy

Fields of Study

  • Materials science

Technology Areas

  • Microelectronics