BI-MODAL Fatigue Curves,
Abstract
The objective of screening tests is to detect workmanship defects in electronic 'black boxes' prior to delivery to the customer. Such tests typically involve subjecting the units under test (UUT) to temperature cycling and random vibration tests. All of the structural elements within the UUT (e.g. the individual piece parts, solder joints, leads wires, support structures) cumulate fatigue damage during the screening test and subsequently during the intended service environment. The cumulative fatigue damage may range from very little to very large depending upon the individual stress levels and number of stress cycles experienced by each structural element. This study will develop the approach to predicting fatigue life and mechanical reliability for such structural elements. The results of this study would be used to analyze the mechanical reliability of all of the structural elements in the UUT as a whole.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1980
- Accession Number
- ADA103210
Entities
People
- R. G. Lambert
Organizations
- General Electric