A Fast Turn-Around Facility for Very Large Scale Integration (VLSI)

Abstract

In order to appreciate the critical hardware and software problems associated with the definition and design of very large scale integrated circuits or integrated systems including 1000 - 1,000,000 transistors in a single silicon chip, incisive experiments conducted with actual operating chips are indispensible. The objective of this project is to establish within a university research environment, a facility for the rapid execution of mask generation, wafer fabrication, and functional testing of user-generated custom I. C. designs.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1981
Accession Number
ADA104000

Entities

People

  • J. Beaudouin
  • James D. Meindl
  • James D. Plummer
  • Robert W. Dutton
  • Roger Fabian W. Pease

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Computer Programs
  • Computers
  • Electron Beam Lithography
  • Electronics
  • Electronics Laboratories
  • Fabrication
  • Geometry
  • Integrated Circuits
  • Manufacturing
  • Measurement
  • Operational Amplifiers
  • Reliability
  • Test Equipment
  • Test Facilities
  • Transducers
  • Very Large Scale Integration

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering