MNOS BORAM Manufacturing Methods and Technology Project.

Abstract

A manufacturing methods project has been initiated to establish production techniques for 8K-bit metal-nitride-oxide semiconductor (MNOS) block-oriented random-access memory (BORAM) devices, to establish the performance adequacy and reproducibility of such MNOS BORAM devices for military environments, and to demonstrate a production rate of 500 multicuip MNOS BORAM hybrid circuits per month. During the past reporting period the project has focused on definition of tests, development of test equipment, and preparation of test programs. In particular, studies have been conducted to determine the feasibility of using an automated retention projection (RP) test as part of a manufacturing screen. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1981
Accession Number
ADA104042

Entities

People

  • J. E. Brewer
  • J. W. Dzimianski

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Amplifiers
  • Data Storage Systems
  • Electronics
  • Failure Mode And Effect Analysis
  • Hybrid Circuits
  • Integrated Circuits
  • Low Voltage
  • Manufacturing
  • Metal Nitride Oxide Semiconductors
  • Military Research
  • Power Supplies
  • Production
  • Semiconductors
  • Shift Registers
  • Standards
  • Test Equipment

Readers

  • Instructional Design and Training Evaluation.
  • Integrated Circuit Design and Technology.
  • Parasitology and Pharmacology of Malaria.

Technology Areas

  • Microelectronics