Microdosimetric Measurements on Nuclear Interactions.
Abstract
The measurements described in this report provide data on the energy deposition spectra and their dependence on incident particle energy which can be compared with theoretical models of the microdosimetry of nuclear interactions. Once thoroughly tested such a model can be used to predict the energy-deposition spectra for volume elements of arbitrary dimensions. This provides a means of quantitative estimates of the soft-error rates to be expected for LSI (Large Scale Integrated) and VLSI (Very Large Scale Integrated) devices to be exposed to energetic particles in space. The cross section for events in which at least a few MeV is deposited within a sensitive volume 4.2 microns thick increases with the proton beam energy in a manner similar to that reported earlier for soft errors in LSI RAMs. Small increases in the threshold energy result in large decreases in the number of events exceeding threshold in a 4.2 microns thick detector. This may explain the large variation in upset sensitivity reported for devices from the same batch. Decreases in the thickness of the sensitive volume greatly reduce the range of energies deposited. This suggests that devices with thinner sensitive elements for the same threshold may have greatly reduced soft-error sensitivity. Such a correlation between sensitivity to soft errors and thickness of the sensitive volume is apparent for exposures to heavy ions. A computer code for calculating the energy deposition in volume elements of arbitrary dimensions as a result of nuclear interactions has been developed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 31, 1981
- Accession Number
- ADA104433
Entities
People
- Peter J. Mcnulty
Organizations
- Clarkson University