Automated X-ray Orientation for Quartz Crystal Resonators.

Abstract

The objective of this program is to develop an automatic X-ray orientation system (AXROS) that is capable of measuring the angles of cut of doubly rotated (SC) quartz crystals, to an accuracy of seconds of arc, on a production basis. The technique selected for the system utilizes recognition of several major spots in a back-reflected Laue pattern in conjunction with a laser measurement of crystal surface orientation to determine the angle of cut. The pattern recognition is done via an algorithm implemented on a dedicated mini-computer. The same computer also drives servo-mechanisms used to rotate and position the crystal. A secondary objective of the program is to use the AXROS measurements to provide the input for an angle correction device to be implemented in conjunction with the AXROS. (Author)

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1981
Accession Number
ADA104945

Entities

People

  • John L. Chambers
  • Myron A. Pugh
  • Robert J. Valihura
  • Robert W. Birrell
  • S. Thomas Workman

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Accuracy
  • Assembly
  • Automatic
  • Continuous Spectra
  • Detection
  • Detectors
  • Diffraction
  • Electronics
  • Fabrication
  • Geometry
  • Manufacturing
  • Measurement
  • Pattern Recognition
  • Recognition
  • Standards
  • X Rays
  • X-Ray Detectors

Fields of Study

  • Physics

Readers

  • Geodesy
  • Prostate Cancer Biology.
  • Robotics and Automation.

Technology Areas

  • AI & ML
  • Directed Energy