High Dose Rate Electron Beam Testing.

Abstract

A test program was designed to investigate test methods utilized for high dose rate e-beam testing of semiconductor components. Several methods used to vary the exposure dose were investigated including the variation of drift chamber pressure and length as well as beam aperturing. The photo response obtained for a 1N916 diode at the HIFX and Hermes facilities were in agreement for the various modes of apparation. In addition, it was found that acceptable dose measurements can be performed at the high intensities if the dosimeters are placed in close proximity to the device under test. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1980
Accession Number
ADA106097

Entities

People

  • T. F. Wrobel

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Aerospace Industry
  • Air Force
  • Barometric Pressure
  • Department Of Defense
  • Dielectrics
  • Dose Rate
  • Dosimeters
  • Electron Beams
  • Electrons
  • Energy
  • Heat Loss
  • Heat Transfer
  • Materials
  • Measurement
  • Semiconductors
  • Specific Heat
  • Test Methods

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Nuclear and Radiation Engineering.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems